Switching of Dipole Coupled Multiferroic Nanomagnets in the Presence of Thermal Noise: Reliability of Nanomagnetic Logic

摘要

The stress-induced switching behavior of a multiferroic nanomagnet, dipolecoupled to a hard nanomagnet, is numerically studied by solving the stochasticLandau-Lifshitz-Gilbert (LLG) equation for a single domain macro-spin state.Different factors were found to affect the switching probability in thepresence of thermal noise at room temperature: (i) dipole coupling strength,(ii) stress levels, and (iii) stress withdrawal rates (ramp rates). We reportthat the thermal broadening of the magnetization distribution causes largeswitching error rates. This could render nanomagnetic logic schemes that relyon dipole coupling to perform Boolean logic operations impractical whether theyare clocked by stress or field or other means.